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5G IC test system - TS-960E - 5G
2021-08-23
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Author:T.Kim

5G IC test system - TS-960E - 5G 

TS-960E - 5G

TS-960E - 5G 

Background

With the continuous deployment of 5G, base stations, small cells, mobile phones and industrial equipment will need standard IC equipment. The inclusion of these components into the supply chain means that IC manufacturers need automated test systems for 5g chips. The automatic test system (ATE) will need to test radios, beamformers, amplifiers and other components operating in the frequency bands of 28 GHz, 39 GHz and below 6 GHz; This requires the ate to include vector network analyzer (VNA) and digital I / O equipment. In 5g test equipment, we notice that more and more ate companies are entering the 5g market. Marvin test solutions cooperates with Rohde & Schwarz to develop 5g IC ATE system, and will also participate in this competition.


Product introduction

1. Hardware part

The ts-960e-5g mmwave test system provides test performance up to 50 GHz. The system integrates the laboratory level RF performance directly into the mmwave device under test (DUT) for multi site production test or device characterization of mmwave devices. In addition, MTS also provides a full set of digital and parameter testing and SPI / I2C interface support to functionally control / monitor the equipment under test.


Main components (as shown in Figure 2):

Rohde & Schwarz znbt40 24 channel, 40 GHz VNA

Marvin test gx7205 PXI chassis provides a dedicated 32 channel, 100 / 125 MHz DIO card and a gx3104 source measurement unit (SMU) for each DUT

Rohde & Schwarz osp320, added 4 1 × 6 switch for intermodulation test

Marvin test head has product interfaces, including the interface of Seiko Epson 8040 Quad site encapsulated device processor

Ts-960e-5g internal structure diagram

Ts-960e-5g internal structure diagram


1) Open short circuit and DC / AC test

The basic version of ate includes 64 dynamic digital I / O channels, 64 static digital I / O channels, a user programmable power supply, a system self-test and fixture. Dynamic digital I / o-gx5296, PMU function of each pin, which can quickly realize open and short circuit and DC test; 125MHz data rate is helpful to realize AC test. Combined with gtdio6xeasy software, pattern file can be written and imported to verify basic functional test. Static digital I / O - gx5733 can well realize switching function and environment variable control;

The upgraded ate can be expanded to 256 dynamic digital channels and 128 static digital channels, which greatly enriches the system resources and is conducive to more large-scale mass production testing.

Ts-960e-5g digital subsystem.png

Ts-960e-5g digital subsystem


2) RF function test part

The znbt40 of Rohde & Schwarz used in ATE is a multi port vector network analyzer with an operating frequency range of 9 kHz to 40 GHz and can provide up to 24 channels. The instrument can test multiple DUTs or measure one DUT at the same time, with up to 24 channels. Even with a large number of ports, it can complete 201 point scanning in a short measurement time of 3.5 Ms.

Znbt40 has a wide dynamic range of up to 135 dB, high output power level and input with high power processing capacity. The instrument is mainly used to develop and produce active and passive multi port components, such as GPS, WLAN, Bluetooth and front-end modules of multi band mobile phones, and can determine all 576 s parameters of 24 channel DUT.

The network analyzer has no display function, which can save space - which is very reasonable for automation products. It can be controlled by external display, mouse and keyboard or external touch screen.

RF test subsystem

RF test subsystem


3) Handler interface

For production test applications that need to be integrated with automatic processors, the ts-960e-5g is equipped with an intest manipulator, which can provide accurate positioning of the test head and interface with automatic detectors and equipment processors. The device interface board (DIB) / receiver interface of ts-960e-5g is compatible with almost any device processor.

 Ts-960e-5g boundary panel.png


Ts-960e-5g boundary panel

EPSON NS-8040

EPSON NS-8040

For mass production testing, the system is equipped with Epson ns-8040 equipment. The product has the characteristics of high stability, easy operation and maintenance, and can carry out the testing of various sealed and transferred chips.


2. Software part

The software execution environment in ATE is ateasy, which can easily complete the preparation and execution management of test programs; At the same time, it is equipped with iceasy semiconductor test software package; Dioeasy fit: pattern conversion and import tool; Gtdio6xeasy: pattern editing tool; 5g VNA, VSA test suite: it can perform spectrum, timing display and statistics, digital modulation analysis, etc.

Ateasy supports a variety of APIs for windows, including LabVIEW, CVI, Microsoft and Borland C / C + +, Microsoft Visual Basic, and Borland Delphi.

Test assembly

Test assembly

Summary

Ts-960e-5g automatic 5g chip test equipment, with mass production test speed and laboratory level test performance; Support 40ghz-53ghz high frequency chip testing; It can realize multi site ft test or wafer test. It is an ideal choice for mmwave equipment / module test and characterization, test product and key product test, and automatic fault analysis.